JPH0236208Y2 - - Google Patents
Info
- Publication number
- JPH0236208Y2 JPH0236208Y2 JP1984187640U JP18764084U JPH0236208Y2 JP H0236208 Y2 JPH0236208 Y2 JP H0236208Y2 JP 1984187640 U JP1984187640 U JP 1984187640U JP 18764084 U JP18764084 U JP 18764084U JP H0236208 Y2 JPH0236208 Y2 JP H0236208Y2
- Authority
- JP
- Japan
- Prior art keywords
- objective lens
- sample
- electron beam
- detector
- secondary electrons
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984187640U JPH0236208Y2 (en]) | 1984-12-11 | 1984-12-11 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984187640U JPH0236208Y2 (en]) | 1984-12-11 | 1984-12-11 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61101956U JPS61101956U (en]) | 1986-06-28 |
JPH0236208Y2 true JPH0236208Y2 (en]) | 1990-10-02 |
Family
ID=30745102
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1984187640U Expired JPH0236208Y2 (en]) | 1984-12-11 | 1984-12-11 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0236208Y2 (en]) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1479621A (en) * | 1974-08-07 | 1977-07-13 | Rank Organisation Ltd | Measuring apparatus |
-
1984
- 1984-12-11 JP JP1984187640U patent/JPH0236208Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS61101956U (en]) | 1986-06-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4037533B2 (ja) | 粒子線装置 | |
JP3081393B2 (ja) | 走査電子顕微鏡 | |
AU753825B2 (en) | Gaseous backscattered electron detector for an environmental scanning electron microscope | |
US4442355A (en) | Device for detecting secondary electrons in a scanning electron microscope | |
JP2899629B2 (ja) | 荷電二次粒子の検出装置 | |
US4728790A (en) | Low-abberation spectrometer objective with high secondary electron acceptance | |
US6667478B2 (en) | Particle beam apparatus | |
US4587425A (en) | Electron beam apparatus and electron collectors therefor | |
JP2632808B2 (ja) | 定量的電位測定用スペクトロメーター対物レンズ装置 | |
US3792263A (en) | Scanning electron microscope with means to remove low energy electrons from the primary electron beam | |
JPH08138611A (ja) | 荷電粒子線装置 | |
JPH0236208Y2 (en]) | ||
JP3244620B2 (ja) | 走査電子顕微鏡 | |
JPH0935679A (ja) | 走査電子顕微鏡 | |
JP2000149850A (ja) | 荷電粒子線装置 | |
US4680468A (en) | Particle detector | |
JP2002025492A (ja) | 静電ミラーを含む荷電粒子ビーム画像化装置用低プロフィル電子検出器を使用して試料を画像化するための方法および装置 | |
US7394069B1 (en) | Large-field scanning of charged particles | |
JPH0236209Y2 (en]) | ||
KR100711198B1 (ko) | 주사형전자현미경 | |
JPH03295141A (ja) | 検出器 | |
JPH0236207Y2 (en]) | ||
JPH0319166Y2 (en]) | ||
JPS58179375A (ja) | 荷電粒子線装置用二次電子検出装置 | |
JP3058657B2 (ja) | 荷電粒子線装置 |